Samankaltaisia teoksia: Journal of materials science
Aihe: Materials
- The formation of structural imperfections in semiconductor silicon /
- Electrical characterization of organic electronic materials and devices /
- Material politics : disputes along the pipeline /
- Scanning probe microscopy for industrial applications : nanomechanical characterization /
- Fatigue of materials and structures ; application to design and damage /
- Self-cleaning materials and surfaces a nanotechnology approach /
Aihe: Materials.
- The formation of structural imperfections in semiconductor silicon /
- Electrical characterization of organic electronic materials and devices /
- Material politics : disputes along the pipeline /
- Scanning probe microscopy for industrial applications : nanomechanical characterization /
- Fatigue of materials and structures ; application to design and damage /
- Self-cleaning materials and surfaces a nanotechnology approach /