Cita APA (7th ed.)
Jiang, W., Ren, T., & Fu, Q. (2024). Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry. Electronics. https://doi.org/10.3390/electronics13020418
Cita Chicago (17th ed.)
Jiang, Wenbo, Tong Ren, i Qianhua Fu. "Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry." Electronics 2024. https://doi.org/10.3390/electronics13020418.
Cita MLA (9th ed.)
Jiang, Wenbo, et al. "Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry." Electronics, 2024, https://doi.org/10.3390/electronics13020418.
Atenció: Aquestes cites poden no estar 100% correctes.