Couttolenc Valdes, S. (2004). Testing methods for current-mode integrated circuits under the very low cost tester (VLCT) and LabView® test platform. ProQuest Dissertations and Theses.
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Cita Chicago Style (17a ed.)
Couttolenc Valdes, Sergio. "Testing Methods for Current-mode Integrated Circuits Under the Very Low Cost Tester (VLCT) and LabView® Test Platform."
ProQuest Dissertations and Theses 2004.
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Cita MLA (9a ed.)
Couttolenc Valdes, Sergio. "Testing Methods for Current-mode Integrated Circuits Under the Very Low Cost Tester (VLCT) and LabView® Test Platform."
ProQuest Dissertations and Theses, 2004.
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