Cita APA (7a ed.)
Lee, C., Kim, Y., & Kim, H. (2024). Computer-Vision-Based Product Quality Inspection and Novel Counting System. Applied System Innovation. https://doi.org/10.3390/asi7060127
Cita Chicago Style (17a ed.)
Lee, Changhyun, Yunsik Kim, y Hunkee Kim. "Computer-Vision-Based Product Quality Inspection and Novel Counting System." Applied System Innovation 2024. https://doi.org/10.3390/asi7060127.
Cita MLA (9a ed.)
Lee, Changhyun, et al. "Computer-Vision-Based Product Quality Inspection and Novel Counting System." Applied System Innovation, 2024, https://doi.org/10.3390/asi7060127.
Precaución: Estas citas no son 100% exactas.