Cita APA (7a ed.)
Sinha, A., Abram, V., Lutterotti, L., & Gialanella, S. (2025). Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications. Materials. https://doi.org/10.3390/ma18030650
Cita Chicago Style (17a ed.)
Sinha, Ankur, Valentino Abram, Luca Lutterotti, y Stefano Gialanella. "Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications." Materials 2025. https://doi.org/10.3390/ma18030650.
Cita MLA (9a ed.)
Sinha, Ankur, et al. "Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications." Materials, 2025, https://doi.org/10.3390/ma18030650.
Precaución: Estas citas no son 100% exactas.