Kim, M., Kim, E., Jung, S., Kim, B., Kim, J., & Kim, S. (2025). Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes. Applied Sciences. https://doi.org/10.3390/app15052251
Copiado correctamente al portapapeles
Error al copiar al portapapeles
Cita Chicago Style (17a ed.)
Kim, Minseok, Eunkyeong Kim, Seunghwan Jung, Baekcheon Kim, Jinyong Kim, y Sungshin Kim. "Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes."
Applied Sciences 2025. https://doi.org/10.3390/app15052251.
Copiado correctamente al portapapeles
Error al copiar al portapapeles
Cita MLA (9a ed.)
Kim, Minseok, et al. "Fault Detection Method Using Auto-Associative Shared Nearest Neighbor Kernel Regression for Industrial Processes."
Applied Sciences, 2025, https://doi.org/10.3390/app15052251.
Copiado correctamente al portapapeles
Error al copiar al portapapeles
Precaución: Estas citas no son 100% exactas.