Cita APA (7a ed.)
Al-Mamun, N. S., Du, Y., Song, J., Chu, R., & Haque, A. (2025). Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing. Micromachines. https://doi.org/10.3390/mi16030242
Cita Chicago Style (17a ed.)
Al-Mamun, Nahid Sultan, Yuxin Du, Jianan Song, Rongming Chu, y Aman Haque. "Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing." Micromachines 2025. https://doi.org/10.3390/mi16030242.
Cita MLA (9a ed.)
Al-Mamun, Nahid Sultan, et al. "Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing." Micromachines, 2025, https://doi.org/10.3390/mi16030242.
Precaución: Estas citas no son 100% exactas.