Cita APA (7a ed.)
Yang, I., Kong, Z. J., Kosmal, T., & Williams, C. (2025). Quality Control and Defect Detection for Wire Arc Additive Manufacturing Using 3D Scanning and Point Cloud Analysis. IISE Annual Conference. Proceedings. https://doi.org/10.21872/2025IISE_6682
Cita Chicago Style (17a ed.)
Yang, Ian, Zhenyu James Kong, Tadek Kosmal, y Christopher Williams. "Quality Control and Defect Detection for Wire Arc Additive Manufacturing Using 3D Scanning and Point Cloud Analysis." IISE Annual Conference. Proceedings 2025. https://doi.org/10.21872/2025IISE_6682.
Cita MLA (9a ed.)
Yang, Ian, et al. "Quality Control and Defect Detection for Wire Arc Additive Manufacturing Using 3D Scanning and Point Cloud Analysis." IISE Annual Conference. Proceedings, 2025, https://doi.org/10.21872/2025IISE_6682.
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