Zhou, H., Lu, L., Yang, K., Shen, L., Yiyu, W., & Wang, Q. (2025). Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions. Electronics. https://doi.org/10.3390/electronics14204027
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Cita Chicago Style (17a ed.)
Zhou, Hong, Liang Lu, Ke Yang, Li Shen, Wen Yiyu, y Qing Wang. "Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions."
Electronics 2025. https://doi.org/10.3390/electronics14204027.
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Cita MLA (9a ed.)
Zhou, Hong, et al. "Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions."
Electronics, 2025, https://doi.org/10.3390/electronics14204027.
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