Cita APA (7a ed.)
Se-Yeon, P., Jeong, E. G., & Sung-Hun, J. (2025). Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments. Micromachines. https://doi.org/10.3390/mi16111212
Cita Chicago Style (17a ed.)
Se-Yeon, Park, Eun Gyo Jeong, y Jo Sung-Hun. "Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments." Micromachines 2025. https://doi.org/10.3390/mi16111212.
Cita MLA (9a ed.)
Se-Yeon, Park, et al. "Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments." Micromachines, 2025, https://doi.org/10.3390/mi16111212.
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