Microelectronics and reliability
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Titre précédent: | Electronics reliability & microminiaturization |
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Format: | Électronique Revue |
Langue: | anglais |
Publié: |
Oxford ; New York :
Pergamon Press,
©1964-
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Sujets: | |
Accès en ligne: | Available in Academic Search Ultimate. Voir à l'OPAC |
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Documents similaires
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