Ижил төстэй зүйлс: Scanning probe microscopy for industrial applications :
- Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM)
- Atomic force microscopy : exploring basic modes and advanced applications /
- Probe microscopy
- Micron the international research and review journal for microscopy.
- Microscopy
- Medical electron microscopy official journal of the Clinical Electron Microscopy Society of Japan.
Сэдэв: Materials
- The formation of structural imperfections in semiconductor silicon /
- Electrical characterization of organic electronic materials and devices /
- Material politics : disputes along the pipeline /
- Scanning probe microscopy for industrial applications : nanomechanical characterization /
- Fatigue of materials and structures ; application to design and damage /
- Self-cleaning materials and surfaces a nanotechnology approach /