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Angle measurement method of electronic speckle interferometry based on Michelson interferometer

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Publicado en:arXiv.org (Nov 20, 2024), p. n/a
Autor principal: Zhu, Siyuan
Otros Autores: Li, Tao, Chen, Zhongshan, Li, Xin
Publicado:
Cornell University Library, arXiv.org
Materias:
Measurement methods
Speckle interferometry
Charge coupled devices
Algorithms
Michelson interferometers
Speckle patterns
Real time
Time measurement
Electronic speckle pattern interferometry
Acceso en línea:Citation/Abstract
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Resumen:{This paper proposes an angle measurement method based on Electronic Speckle Pattern Interferometry (ESPI) using a Michelson interferometer. By leveraging different principles within the same device, this method achieves complementary advantages across various angle ranges, enhancing measurement accuracy while maintaining high robustness. By utilizing CCD to record light field information in real time and combining geometric and ESPI methods, relationships between small angles and light field information are established, allowing for the design of relevant algorithms for real-time angle measurement. Numerical simulations and experiments were conducted to validate the feasibility and practicality of this method. Results indicate that it maintains measurement accuracy while offering a wide angle measurement range, effectively addressing the limitations of small angle measurements in larger ranges, showcasing significant potential for widespread applications in related fields.
ISSN:2331-8422
Fuente:Engineering Database