Identification and Localization Study of Grounding System Defects in Cross-Bonded Cables

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Publicado no:Electronics vol. 14, no. 3 (2025), p. 622
Autor principal: Zhang, Qiying
Outros Autores: Li, Kunsheng, Chen, Lian, Luo, Jian, Zhao, Zhongyong
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MDPI AG
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024 7 |a 10.3390/electronics14030622  |2 doi 
035 |a 3165772372 
045 2 |b d20250101  |b d20251231 
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100 1 |a Zhang, Qiying  |u College of Engineering and Technology, Southwest University, Chongqing 400716, China; <email>zhangzhangqi@email.swu.edu.cn</email> (Q.Z.); 
245 1 |a Identification and Localization Study of Grounding System Defects in Cross-Bonded Cables 
260 |b MDPI AG  |c 2025 
513 |a Journal Article 
520 3 |a Cross-bonded cables improve transmission efficiency by optimizing the grounding method. However, due to the complexity of their grounding system, they are prone to multiple types of defects, making defect state identification more challenging. Additionally, accurately locating sheath damage defects becomes more difficult in cases of high transition resistance. To address these issues, this paper constructs a distributed parameter circuit model for cross-bonded cables and proposes a particle swarm optimization support vector machine (PSO-SVM) defect classification model based on the sheath voltage and current phase angle and amplitude characteristics. This model effectively classifies 25 types of grounding system states. Furthermore, for two types of defects—open joints and sheath damage short circuits—this paper proposes an accurate segment-based location method based on fault impedance characteristics, using zero-crossing problems to achieve efficient localization. The results show that the distributed parameter circuit model for cross-bonded cables is feasible for simulating electrical quantities, as confirmed by both simulation and real-world applications. The defect classification model achieves an accuracy of over 97%. Under low transition resistance, the defect localization accuracy exceeds 95.4%, and the localization performance is significantly improved under high transition resistance. Additionally, the defect localization method is more sensitive to variations in cable segment length and grounding resistance impedance but less affected by fluctuations in core voltage and current. 
653 |a Particle swarm optimization 
653 |a Classification 
653 |a Defects 
653 |a Parameter sensitivity 
653 |a Voltage 
653 |a Damage detection 
653 |a Boxes 
653 |a Electrical grounding 
653 |a Localization 
653 |a Impedance 
653 |a Accuracy 
653 |a Localization method 
653 |a Parameter identification 
653 |a Electric cables 
653 |a Cables 
653 |a Support vector machines 
653 |a Electric potential 
653 |a Bonded joints 
653 |a Sheaths 
653 |a Methods 
653 |a Transmission efficiency 
653 |a Algorithms 
653 |a Short circuits 
653 |a Segments 
700 1 |a Li, Kunsheng  |u Ultra High Voltage Branch of State Grid Chongqing Electric Power Company, Chongqing 400716, China 
700 1 |a Chen, Lian  |u College of Engineering and Technology, Southwest University, Chongqing 400716, China; <email>zhangzhangqi@email.swu.edu.cn</email> (Q.Z.); 
700 1 |a Luo, Jian  |u College of Electrical Engineering, Chongqing University, Chongqing 400716, China 
700 1 |a Zhao, Zhongyong  |u College of Engineering and Technology, Southwest University, Chongqing 400716, China; <email>zhangzhangqi@email.swu.edu.cn</email> (Q.Z.); 
773 0 |t Electronics  |g vol. 14, no. 3 (2025), p. 622 
786 0 |d ProQuest  |t Advanced Technologies & Aerospace Database 
856 4 1 |3 Citation/Abstract  |u https://www.proquest.com/docview/3165772372/abstract/embedded/H09TXR3UUZB2ISDL?source=fedsrch 
856 4 0 |3 Full Text + Graphics  |u https://www.proquest.com/docview/3165772372/fulltextwithgraphics/embedded/H09TXR3UUZB2ISDL?source=fedsrch 
856 4 0 |3 Full Text - PDF  |u https://www.proquest.com/docview/3165772372/fulltextPDF/embedded/H09TXR3UUZB2ISDL?source=fedsrch