Fatigue-free ferroelectricity in Hf0.5Zr0.5O2 ultrathin films via interfacial design

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Detalles Bibliográficos
Publicado en:	Nature Communications vol. 16, no. 1 (2025), p. 7593-7602
Autor principal:	Zhou, Chao
Otros Autores:	Feng, Yanpeng, Ma, Liyang, Huang, Haoliang, Si, Yangyang, Wang, Hailin, Huang, Sizhe, Li, Jingxuan, Kuo, Chang-Yang, Das, Sujit, Tang, Yunlong, Liu, Shi, Chen, Zuhuang
Publicado:	Nature Publishing Group
Materias:	Commercialization Behavior Films Oxygen ions Heterostructures Capacitors Ferroelectricity Fatigue failure Thin films Design Defects Ferroelectrics Materials fatigue Oxygen Reliability Electric fields Coercivity Cerium oxides Ferroelectric materials Cycles Phase transitions Memory devices Hafnium oxide Interfaces Environmental
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