Distributed Adaptive Push-Button Forensics

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Publicado no:The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings (2025), p. 24-25
Autor principal: Kebande, Victor
Publicado em:
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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024 7 |a 10.1109/FMEC65595.2025.11119242  |2 doi 
035 |a 3247344074 
045 2 |b d20250101  |b d20251231 
084 |a 228229  |2 nlm 
100 1 |a Kebande, Victor  |u Blekinge Institute of Technology,Sweden 
245 1 |a Distributed Adaptive Push-Button Forensics 
260 |b The Institute of Electrical and Electronics Engineers, Inc. (IEEE)  |c 2025 
513 |a Conference Proceedings 
520 3 |a Conference Title: 2025 10th International Conference on Fog and Mobile Edge Computing (FMEC)Conference Start Date: 2025 May 19Conference End Date: 2025 May 22Conference Location: Tampa, FL, USADigital Forensics (DF) in distributed environments faces significant challenges, ranging from scalability, complexity, and reliance on traditional DF processes. The problem being addressed in this paper, is the lack of effective automated DF analysis across distributed ecosystems. Inspired by the success of peer-to-peer ($\mathbf{P 2 P}$) architectures, and as a step toward overcoming the limitations of traditional client-server models, a Distributed Adaptive Push-button Forensic (DAPF) System that leverages a decentralized approach is suggested. The DAPF system automates attack data collection and analysis across multiple nodes in an adaptive approach to streamline DF investigations. Preliminary experiments have demonstrated a $\mathbf{3 0 \%}$ reduction in analysis time compared to traditional methods. This work highlights the potential of automation, adaptability, and decentralized architectures in modern DF a step towards distributed digital forensics. 
653 |a Forensic sciences 
653 |a Automation 
653 |a Client server systems 
653 |a Computer forensics 
653 |a Forensic computing 
653 |a Edge computing 
653 |a Data collection 
653 |a Mobile computing 
773 0 |t The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings  |g (2025), p. 24-25 
786 0 |d ProQuest  |t Science Database 
856 4 1 |3 Citation/Abstract  |u https://www.proquest.com/docview/3247344074/abstract/embedded/L8HZQI7Z43R0LA5T?source=fedsrch