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Generation of WAAM Defect Images Using a Hybrid CVAE-CGAN: A Data Augmentation Strategy for Small and Imbalanced Datasets

Guardat en:
Publicat a:The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings (2025), p. 1-6
Autor principal: Yang, Junle
Altres autors: Yuan, Lei, Mu, Haochen, He, Fengyang, Ding, Donghong, Pan, Zengxi, Li, Huijun
Publicat:
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Matèries:
Datasets
Data augmentation
Image resolution
Machine learning
Defects
Intelligent manufacturing systems
Melt pools
Economic
Accés en línia:Citation/Abstract
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