LeafPoseNet: A low-cost, high-accuracy method for estimating flag leaf angle in wheat
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| Publicado en: | Crop Journal vol. 13, no. 5 (Oct 2025), p. 1543-1554 |
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| Autor principal: | |
| Otros Autores: | , , , , , |
| Publicado: |
KeAi Publishing Communications Ltd
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| Materias: | |
| Acceso en línea: | Citation/Abstract Full Text Full Text - PDF |
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| Resumen: | Flag leaf angle (FLANG) is one of the key traits in wheat breeding due to its impact on plant architecture, light interception, and yield potential. An image-based method of measuring FLANG in wheat would reduce the labor and error of manual measurement of this trait. We describe a method for acquiring in-field FLANG images and a lightweight deep learning model named LeafPoseNet that incorporates a spatial attention mechanism for FLANG estimation. In a test dataset with wheat varieties exhibiting diverse FLANG, LeafPoseNet achieved high accuracy in predicting the FLANG, with a mean absolute error (MAE) of 1.75°, a root mean square error (RMSE) of 2.17°, and a coefficient of determination (К?) of 0.998, significantly outperforming established models such as YOLO12x-pose, YOLO11x-pose, HigherHRNet, Lightweight-OpenPose, and LitePose. We performed phenotyping and genome-wide association study to identify the genomic regions associated with FLANG in a panel of 221 diverse bread wheat genotypes, and identified 10 quantitative trait loci. Among them, qFLANG2B.2 was found to harbor a potential causal gene, TraesCS2B01G313700, which may regulate FLANG formation by modulating brassinosteroid levels. This method provides a low-cost, high-accuracy solution for in-field phenotyping of wheat FLANG, facilitating both wheat FLANG genetic studies and ideal plant type breeding. |
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| ISSN: | 2095-5421 2214-5141 |
| DOI: | 10.1016/j.cj.2025.07.002 |
| Fuente: | Agriculture Science Database |