Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devices /
"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the same boo...
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| Autor principal: | |
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| Formato: | Recurso Electrónico livro electrónico |
| Idioma: | inglês |
| Publicado em: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2013.
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| Assuntos: | |
| Acesso em linha: | https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/178093 Ver en el OPAC |
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