Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devices /

"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the same boo...

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Détails bibliographiques
Auteur principal: Epperlein, Peter W.
Format: Électronique eBook
Langue:anglais
Publié: Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2013.
Sujets:
Accès en ligne:https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/178093
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