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Digital holography for MEMS and microsystem metrology /

Furkejuvvon:
Eará dahkkit: Asundi, Anand
Materiálatiipa: Elektrovnnalaš E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, 2011.
Ráidu:Wiley microsystem and nanotechnology series.
Fáttát:
Microelectromechanical systems > Measurement.
Microelectronics > Measurement.
Holographic testing.
Image processing > Digital techniques.
Electronic books.
Liŋkkat:https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/182903
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Olgguldas hápmi:xxii, 205 p. : ill., port.
Bibliografiija:Includes bibliographical references and index.
ISBN:9781119997306

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