Electronic device failure analysis

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Detalles Bibliográficos
Título anterior:	Electronic device failure analysis news
Autores Corporativos:	ASM International, Electronic Device Failure Analysis Society
Formato:	Electrónico Revista
Lenguaje:	inglés
Publicado:	Materials Park, OH : ASM International
Materias:	Electronic apparatus and appliances > Reliability > Periodicals. Electronic apparatus and appliances > Testing > Periodicals. System failures (Engineering) > Periodicals. Electronic apparatus and appliances > Reliability. Electronic apparatus and appliances > Testing. System failures (Engineering) Electronic journals. Periodicals.
Acceso en línea:	Available in Academic Search Ultimate. Ver en el OPAC
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