A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

-д хадгалсан:

Номзүйн дэлгэрэнгүй
-д хэвлэсэн:	arXiv.org (Sep 9, 2024), p. n/a
Үндсэн зохиолч:	Lanzieri, Leandro
Бусад зохиолчид:	Martino, Gianluca, Fey, Goerschwin, Schlarb, Holger, Schmidt, Thomas C, Wählisch, Matthias
Хэвлэсэн:	Cornell University Library, arXiv.org
Нөхцлүүд:	Microcontrollers Embedded systems Field programmable gate arrays Hardware System on chip Aging Safety critical
Онлайн хандалт:	Citation/Abstract Full text outside of ProQuest
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!

Тодорхойлолт
Хураангуй:	Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial to understand ageing processes and to detect hardware degradation early for guaranteeing system dependability. In this survey, we review the core ageing mechanisms, identify and categorize general working principles of ageing detection and monitoring techniques for Commercial-Off-The-Shelf (COTS) components that are prevalent in embedded systems: Field Programmable Gate Arrays (FPGAs), microcontrollers, System-on-Chips (SoCs), and their power supplies. From our review, we find that online techniques are more widely applied on FPGAs than on other components, and see a rising trend towards machine learning application for analysing hardware ageing. Based on the reviewed literature, we identify research opportunities and potential directions of interest in the field. With this work, we intend to facilitate future research by systematically presenting all main approaches in a concise way.
ISSN:	2331-8422
DOI:	10.1145/3695247
Эх сурвалж:	Engineering Database