A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems
保存先:
| 出版年: | arXiv.org (Sep 9, 2024), p. n/a |
|---|---|
| 第一著者: | |
| その他の著者: | , , , , |
| 出版事項: |
Cornell University Library, arXiv.org
|
| 主題: | |
| オンライン･アクセス: | Citation/Abstract Full text outside of ProQuest |
| タグ: |
タグなし, このレコードへの初めてのタグを付けませんか!
|
| 抄録: | Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial to understand ageing processes and to detect hardware degradation early for guaranteeing system dependability. In this survey, we review the core ageing mechanisms, identify and categorize general working principles of ageing detection and monitoring techniques for Commercial-Off-The-Shelf (COTS) components that are prevalent in embedded systems: Field Programmable Gate Arrays (FPGAs), microcontrollers, System-on-Chips (SoCs), and their power supplies. From our review, we find that online techniques are more widely applied on FPGAs than on other components, and see a rising trend towards machine learning application for analysing hardware ageing. Based on the reviewed literature, we identify research opportunities and potential directions of interest in the field. With this work, we intend to facilitate future research by systematically presenting all main approaches in a concise way. |
|---|---|
| ISSN: | 2331-8422 |
| DOI: | 10.1145/3695247 |
| ソース: | Engineering Database |