Testing methods for current-mode integrated circuits under the very low cost tester (VLCT) and LabView® test platform

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Bibliographic Details
Published in:	ProQuest Dissertations and Theses (2004)
Main Author:	Couttolenc Valdes, Sergio
Published:	ProQuest Dissertations & Theses
Subjects:	Electrical engineering
Online Access:	Citation/Abstract Full Text - PDF
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