Scanning probe microscopy for industrial applications : nanomechanical characterization /
Bewaard in:
| Andere auteurs: | |
|---|---|
| Formaat: | Elektronisch E-boek |
| Taal: | Engels |
| Gepubliceerd in: |
Hoboken, New Jersey :
Wiley,
2014.
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| Onderwerpen: | |
| Online toegang: | https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/185257 Ver en el OPAC |
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