Microelectronics and reliability

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Bibliographic Details
Previous Title:Electronics reliability & microminiaturization
Format: Electronic Journal
Language:English
Published: Oxford ; New York : Pergamon Press, ©1964-
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Online Access:Available in Academic Search Ultimate.
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Description
Published:Vol 3, no. 1 (June 1964)-
Item Description:Title from cover.
Publication Frequency:Monthly, <1997->
ISSN:1872-941X
0026-2714