Cita APA (7a ed.)
Dai, D., Wang, Z., Huang, H., Xu, M., Yehong, L., Li, H., & Chen, D. (2025). The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection. Agriculture. https://doi.org/10.3390/agriculture15151649
Cita Chicago Style (17a ed.)
Dai, Dong, Zhenyu Wang, Hao Huang, Mao Xu, Liu Yehong, Hao Li, y Du Chen. "The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection." Agriculture 2025. https://doi.org/10.3390/agriculture15151649.
Cita MLA (9a ed.)
Dai, Dong, et al. "The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection." Agriculture, 2025, https://doi.org/10.3390/agriculture15151649.
Precaución: Estas citas no son 100% exactas.