Dai, D., Wang, Z., Huang, H., Xu, M., Yehong, L., Li, H., & Chen, D. (2025). The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection. Agriculture. https://doi.org/10.3390/agriculture15151649
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Citazione stile Chigago Style (17a edizione)
Dai, Dong, Zhenyu Wang, Hao Huang, Mao Xu, Liu Yehong, Hao Li, e Du Chen. "The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection."
Agriculture 2025. https://doi.org/10.3390/agriculture15151649.
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Citatione MLA (9a ed.)
Dai, Dong, et al. "The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection."
Agriculture, 2025, https://doi.org/10.3390/agriculture15151649.
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Attenzione: Queste citazioni potrebbero non essere precise al 100%.