Quality Control and Defect Detection for Wire Arc Additive Manufacturing Using 3D Scanning and Point Cloud Analysis

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Detalles Bibliográficos
Publicado en:	IISE Annual Conference. Proceedings (2025), p. 1-7
Autor principal:	Yang, Ian
Otros Autores:	Kong, Zhenyu James, Kosmal, Tadek, Williams, Christopher
Publicado:	Institute of Industrial and Systems Engineers (IISE)
Materias:	Machine learning Wire Data processing Cooling Quality control Defects Scanners Prediction models Lasers Residual stress Neural networks Sensors Three dimensional models Normal distribution 3-D printers Three dimensional printing Visual programming languages Manufacturing Additive manufacturing Process parameters
Acceso en línea:	Citation/Abstract Full Text Full Text - PDF
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