Quality Control and Defect Detection for Wire Arc Additive Manufacturing Using 3D Scanning and Point Cloud Analysis

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書誌詳細
出版年:	IISE Annual Conference. Proceedings (2025), p. 1-7
第一著者:	Yang, Ian
その他の著者:	Kong, Zhenyu James, Kosmal, Tadek, Williams, Christopher
出版事項:	Institute of Industrial and Systems Engineers (IISE)
主題:	Machine learning Wire Data processing Cooling Quality control Defects Scanners Prediction models Lasers Residual stress Neural networks Sensors Three dimensional models Normal distribution 3-D printers Three dimensional printing Visual programming languages Manufacturing Additive manufacturing Process parameters
オンライン･アクセス:	Citation/Abstract Full Text Full Text - PDF
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