ESD : failure mechanisms and models /

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Detaylı Bibliyografya
Yazar:	Voldman, Steven H.
Materyal Türü:	Elektronik Ekitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009.
Konular:	Semiconductors > Failures. Integrated circuits > Protection. Integrated circuits > Testing. Integrated circuits > Reliability. Electric discharges. Electrostatics. Electronic books.
Online Erişim:	https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/179897 OPAC'ta görüntüle
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100	1		\|a Voldman, Steven H.
245	1	0	\|a ESD : \|b failure mechanisms and models / \|c Steven H. Voldman.
246	3		\|a Electrostatic discharge
264		1	\|a Chichester, West Sussex, U.K. ; \|a Hoboken, NJ : \|b J. Wiley, \|c 2009.
300			\|a xxiv, 384 p.
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588			\|a Description based on metadata supplied by the publisher and other sources.
590			\|a Electronic resource. Santa Fe, Argentina: elibro, 2025. Available via the World Wide Web. Access may be limited to libraries affiliated with elibro.
650		0	\|a Semiconductors \|x Failures.
650		0	\|a Integrated circuits \|x Protection.
650		0	\|a Integrated circuits \|x Testing.
650		0	\|a Integrated circuits \|x Reliability.
650		0	\|a Electric discharges.
650		0	\|a Electrostatics.
655		4	\|a Electronic books.
797	2		\|a elibro, Corp.
856	4	0	\|u https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/179897