Atomic force microscopy : exploring basic modes and advanced applications /
Guardado en:
| Hovedforfatter: | |
|---|---|
| Format: | Electronisk eBog |
| Sprog: | engelsk |
| Udgivet: |
Hoboken, N.J. :
John Wiley & Sons,
[2012]
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| Fag: | |
| Online adgang: | https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/183811 Ver en el OPAC |
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Lignende værker: Atomic force microscopy :
- Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM)
- Síntesis y caracterización de recubrimientos de TiN, TiC, TiCN sobre acero AISI 4340
- Probe microscopy
- Microscopy research and technique
- Scanning probe microscopy for industrial applications : nanomechanical characterization /
- Low voltage electron microscopy principles and applications /