Effective Tomato Spotted Wilt Virus Resistance Assessment Using Non-Destructive Imaging and Machine Learning

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Bibliografiset tiedot
Julkaisussa:	Horticulturae vol. 11, no. 2 (2025), p. 132
Päätekijä:	Kim, Sang Gyu
Muut tekijät:	Sang-Deok, Lee, Woo-Moon, Lee, Hyo-Bong Jeong, Yu, Nari, Oak-Jin, Lee, Lee, Hye-Eun
Julkaistu:	MDPI AG
Aiheet:	Infections Plant viruses Software Pathogens Disease resistance Deep learning Nondestructive testing Antibodies Tomatoes Leaves Image processing Machine learning Automation Statistical analysis Enzyme-linked immunosorbent assay Plant diseases Learning algorithms Agriculture Data analysis Neural networks Support vector machines Computer vision Genetic resources Medical research Viruses Surveys Antigens Wilt Enzymes Strains (organisms) Environmental
Linkit:	Citation/Abstract Full Text + Graphics Full Text - PDF
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