תמונות העטיפה

Verification methods for complex-functional blocks in CAD for chips deep submicron design standards

שמור ב:
הוצא לאור ב:E3S Web of Conferences vol. 376 (2023), p. n/a
מחבר ראשי: Zolnikov, Vladimir
מחברים אחרים: Zolnikov, Konstantin, Ilina, Nadezhda, Grabovy, Kirill
יצא לאור:
EDP Sciences
נושאים:
Russia
Very large scale integration
Design standards
Verification
Circuit design
Integrated circuits
Software
Semiconductors
Environmental
גישה מקוונת:Citation/Abstract
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Resumen:The article discusses the design stages of very large-scale integrated circuits (VLSI) and the features of the procedure for verifying complex-functional VLSI blocks. The main approaches to microcircuit verification procedures are analyzed to minimize the duration of verification cycles. In practice, a combination of several approaches to verification is usually used.
ISSN:2555-0403
2267-1242
DOI:10.1051/e3sconf/202337601090
Fuente:Engineering Database