The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection

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I whakaputaina i:Agriculture vol. 15, no. 15 (2025), p. 1649-1671
Kaituhi matua: Dai, Dong
Ētahi atu kaituhi: Wang, Zhenyu, Huang, Hao, Xu, Mao, Liu Yehong, Li, Hao, Chen, Du
I whakaputaina:
MDPI AG
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