Electrical overstress (EOS) : devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clea...

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Detalles Bibliográficos

Autor Principal:	Voldman, Steven H.
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
Series:	ESD series
Materias:	Semiconductors > Failures. Semiconductors > Protection. Transients (Electricity) Overvoltage. Electronic books.
Acceso en liña:	https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/185246 Ver en el OPAC
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