Electrical overstress (EOS) : devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clea...

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書目詳細資料

主要作者:	Voldman, Steven H.
格式:	電子 電子書
語言:	英语
出版:	Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
叢編:	ESD series
主題:	Semiconductors > Failures. Semiconductors > Protection. Transients (Electricity) Overvoltage. Electronic books.
在線閱讀:	https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/185246 Ver en el OPAC
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