Electrical overstress (EOS) : devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clea...

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Bibliographic Details

Main Author:	Voldman, Steven H.
Format:	Electronic eBook
Language:	English
Published:	Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
Series:	ESD series
Subjects:	Semiconductors > Failures. Semiconductors > Protection. Transients (Electricity) Overvoltage. Electronic books.
Online Access:	https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/185246 View in OPAC
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