Electrical overstress (EOS) : devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clea...
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
|
| Cyfres: | ESD series
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| Pynciau: | |
| Mynediad Ar-lein: | https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/185246 Ver en el OPAC |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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