Electrical overstress (EOS) : devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clea...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awdur: Voldman, Steven H.
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
Cyfres:ESD series
Pynciau:
Mynediad Ar-lein:https://biblioteca.ues.edu.sv/acceso/elibro/?url=https%3A%2F%2Felibro.net%2Fereader%2Fbiblioues/185246
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